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<scp>WSXM</scp>: A software for scanning probe microscopy and a tool for nanotechnology

Review of Scientific Instruments · 2007 · Vol. 78(1) · pp. 013705–013705
Ignacio HorcasRobert FernandezJosé M. Gómez‐RodríguezJ. ColcheroJulio Gómez‐HerreroA. M. Baró

Abstract

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

Force Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaMechanical and Optical ResonatorsSoftwareScanning probe microscopyComputer scienceMicroscopySection (typography)Perspective (graphical)NanotechnologyMaterials scienceOpticsArtificial intelligence

MeSH terms

Image EnhancementSoftwareMicroscopy, Atomic ForceNanotechnology
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References
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