articleTop 1% cited
Tunneling spectroscopy of the Si(111)2 × 1 surface
Surface Science · 1987 · Vol. 181(1-2) · pp. 295–306
R. M. Feenstra✉(IBM (United States))Joseph A. Stroscio(IBM (United States))A. P. Fein(IBM (United States))
Surface and Thin Film PhenomenaForce Microscopy Techniques and ApplicationsAdvanced Materials Characterization TechniquesScanning tunneling spectroscopyScanning tunneling microscopeTungstenFermi levelQuantum tunnellingChemistryCondensed matter physicsRADIUSRadius of curvatureSpectroscopy
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615
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References
Theory of the scanning tunneling microscope
Physical review. B, Condensed matter · 1985 · 4,300 citations
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