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A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies

IEEE Transactions on Instrumentation and Measurement · 1989 · Vol. 38(3) · pp. 789–793
D.K. GhodgaonkarV. V. VaradanV. K. Varadan

Abstract

For measurements of dielectric properties of planar slabs of ceramic and composite materials, the authors have developed a free-space measurement system in the frequency range of 14.5-17.5 GHz. The key components of the measurement system are a pair of spot-focusing horn lens antennas, a network analyzer, and a computer. Because of the far-field focusing ability of horn lens antennas, the free-space measurements can be made at microwave frequencies in a relatively compact and simple measurement setup. The time-domain gating feature of the network analyzer and the thru, reflect, and line calibration technique were used to eliminate the effects of undesirable multiple reflections. The dielectric constants and loss tangents were measured for standard materials such as fused quartz, Teflon, and polyvinylchloride (PVC). Dielectric properties for Teflon and PVC were also measured in a waveguide medium for purposes of comparison with the free-space method.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Microwave and Dielectric Measurement TechniquesMicrowave Engineering and WaveguidesPhotonic and Optical DevicesNetwork analyzer (electrical)DielectricDissipation factorMicrowaveMaterials scienceLens (geology)CalibrationOpticsWaveguideDielectric loss
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