Material Characterization Using Complementary Split-Ring Resonators

Abstract

A microwave method based on complementary split-ring resonators (CSRRs) is proposed for dielectric characterization of planar materials. The technique presents advantages such as high measurement sensitivity and eliminates the extensive sample preparation procedure needed in resonance-based methods. A sensor in the shape of CSRRs working at a 0.8-1.3 GHz band is demonstrated. The sensor is etched in the ground plane of a microstrip line to effectively create a stopband filter. The frequencies at which minimum transmission and minimum reflection are observed depend on the permittivity of the sample under test. The minimum transmission frequency shifts from 1.3 to 0.8 GHz as the sample permittivity changes from 1 to 10. The structure is fabricated using printed circuit board technology. Numerical findings are experimentally verified.