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Millimeter-wave CMOS design

IEEE Journal of Solid-State Circuits · 2005 · Vol. 40(1) · pp. 144–155
C.H. DoanSohrab EmamiAli M. NiknejadR.W. Brodersen

Abstract

This paper describes the design and modeling of CMOS transistors, integrated passives, and circuit blocks at millimeter-wave (mm-wave) frequencies. The effects of parasitics on the high-frequency performance of 130-nm CMOS transistors are investigated, and a peak f/sub max/ of 135 GHz has been achieved with optimal device layout. The inductive quality factor (Q/sub L/) is proposed as a more representative metric for transmission lines, and for a standard CMOS back-end process, coplanar waveguide (CPW) lines are determined to possess a higher Q/sub L/ than microstrip lines. Techniques for accurate modeling of active and passive components at mm-wave frequencies are presented. The proposed methodology was used to design two wideband mm-wave CMOS amplifiers operating at 40 GHz and 60 GHz. The 40-GHz amplifier achieves a peak |S/sub 21/| = 19 dB, output P/sub 1dB/ = -0.9 dBm, IIP3 = -7.4 dBm, and consumes 24 mA from a 1.5-V supply. The 60-GHz amplifier achieves a peak |S/sub 21/| = 12 dB, output P/sub 1dB/ = +2.0 dBm, NF = 8.8 dB, and consumes 36 mA from a 1.5-V supply. The amplifiers were fabricated in a standard 130-nm 6-metal layer bulk-CMOS process, demonstrating that complex mm-wave circuits are possible in today's mainstream CMOS technologies.

Radio Frequency Integrated Circuit DesignMicrowave Engineering and WaveguidesAdvanced Power Amplifier DesignCMOSAmplifierExtremely high frequencyParasitic extractionElectrical engineeringCoplanar waveguideTransistorMicrostripOptoelectronicsWideband
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References
On-chip spiral inductors with patterned ground shields for Si-based RF ICs
IEEE Journal of Solid-State Circuits · 1998 · 1,127 citations
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