articleTop 10% cited
Analysis of positron profiling data by means of ‘‘VEPFIT’’
AIP conference proceedings · 1991 · Vol. 218 · pp. 171–198
A. van Veen✉(Delft University of Technology)H. Schut(Delft University of Technology)J. de Vries(Delft University of Technology)Rudi A. Hakvoort(Delft University of Technology)M. R. Ijpma(Delft University of Technology)
Abstract
The program VEPFIT is presented which extrats the relevant parameters from positron measurements on implanted materials and layered structures. Measurements of the Doppler Broadening parameter S and the positronium fraction F vs the energy of the incident positrons are analyzed by means of a semi‐linear fitting procedure. The principles of the analysis method are given and the performance of the program on artificially and experimentally obtained data is demonstrated. Fitting strategies are outlined and the accuracy of the fitting results is discussed.
Muon and positron interactions and applicationsParticle Detector Development and PerformanceRadiation Detection and Scintillator TechnologiesPositronPositroniumDoppler broadeningProfiling (computer programming)Computational physicsDoppler effectPhysicsNuclear physicsComputer scienceSpectral line
Citations
480
FWCI
6.20
field-weighted impact
References
0
Percentile
96%
vs. same field & year
Citations per year
Citation Network
How this paper connects to the literature. Drag to explore, click any node to open that paper.